Measurement of transient characteristics of fast semiconductor devices

PhD study program: Measurement Technology
Akademic year: 2018-2019
Advisor: Prof. Ing. Alexander Šatka, CSc. (umersatk@savba.sk)
External educational institution: Institute of Measurement Science SAS
Accepting university: Faculty of Electrical Engineering and Information Technology, Slovak University of Technology in Bratislava, Institute of Electrical Engineering
Max. number of students: 1
Study language: Slovak/English

Annotation:
The goal of the thesis is to develop measurement methods for determination of transient electrical characteristics of very fast semiconductor switching devices and circuits and to investigate uncertainties in determination of their large-signal parameters. Development of the time domain pulse reflectometry for measurement of input and output characteristics of semiconductor switches and logic circuits as well as extraction of their electrical and behavioural models is envisaged. Person interested in the theme should have knowledge about properties of electronic devices, basic knowledge about the theory of electromagnetic fields and computer analysis of electronic circuits to the extent of technology and natural sciences university study programs. Knowledge of the programming in LabView environment will be advantage. PhD student will gather a wide spectrum of new knowledge about electronic measurement of electronic devices and circuits and their application in determination of parameters of their models, with application in the design, measurement and testing of electronic devices and systems.

back