6.6.2012

On June 5, 2012, Dr. Dominique Neerinck, representative of the Belgian company Bekaert visited the Institute of Measurement Science SAS accompanied by Ing. Juraj Lapin, DrSc., vicepresident of the SAS for Section I and  prof. PharmDr. Daniela Ježová, DrSc., vicepresident of the SAS. The visit was a continuation of the visit of SAS representatives in Belgium and a visit in the Institute of Inorganic Chemistry SAS and the Polymere Institute SAS. 

Director of the IMS SAS Assoc.prof. Tyšler welcommed the guests in the Institute and introduced its main research activities and selected laboratories. In the next presentation Ing. Vavra from the Institute of Electrical Engineering SAS introduced the FIB laboratory and Laboratory of X-ray difractometry that are located also in the  IMS SAS building. In the last presentation, prof. Simančík, director of the Institute of Materials and Machine Mechanics presented the Institute's profile and its important applied results.

The meeting was followed by excursions to several laboratories: Laboratory of X-ray tomography (RNDr. Hain, IMS SAS), Laboratories of the National MR Center (prof. Frollo, IMS SAS), FIB Laboratory (Ing. Vávra IEl SAS), Electron Microscopy Laboratory (Ing. Nosko IMMM SAS) and Laboratory of X-ray difractometry (Assoc.prof. Dobročka, IEE SAS).

Photos from the visit can be found here.