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Other bilateral project
Project duration: 01/2006 - 12/2016
Principal investigator: RNDr. Miroslav Hain, PhD.
Co-operating institutions: Nanoelektronics Research Institute / Photonics Research Institute, AIST, Tsukuba Japan
The focus of cooperation is aimed at the development of optical methods for measurement of spectral characteristics of reflectance, transmittance and absorptance of optical materials for nanoelectronics.
In 2014 cooperation between Institute of Measurement Science SAS and Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan was focused on the development of optical methods for measurement of spectral characteristics of reflectance, transmittance and absorptance of materials used in nanoelectronics.
In 2015 the cooperation between Institute of Measurement Science SAS and Electronics and Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan has continued. The focus of cooperation is aimed at development of optical methods for measurement the spectral characteristics of reflectance, transmittance and absorptance of optical materials.
Patents:
Kawate, Etsuo – Hain, Miroslav. Optical Characteristic Measurement Device. Patent č. WO 2012/121323 A1. 13.09.2012. (PCT/JP2012/055945, 08.03.2012). Owner: National Institute of Advanced Industrial Science and Technology, Tokyo, Japan; Kawate Etsuo; Hain Miroslav.
Kawate, Etsuo – Hain, Miroslav. Optical Characteristic Measuring Apparatus. Patent č. US 8 982 345 B2. 17.03.2015. (PCT/JP2012/055945, 08.03.2012). Owner: National Institute of Advanced Industrial Science and Technology, Tokyo, Japan; Kawate Etsuo; Hain Miroslav.
Publications:
KAWATE, E. - HAIN, M. Study of uncertainty sources in incident angle dependence of regular reflectance and transmittance using a STAR GEM accessory. In MEASUREMENT 2013 : 9th International Conference on Measurement. Bratislava : Institute of Measurement Science, SAS, 2013, p. 183-186.
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